Magnetic Force Microscope

Asylum Research MFP-3D Stand Alone AFM

A more detailed description can be found in IRM Quarterly v. 23, n. 2, Summer 2013.

Specifications:


The Magnetic force microscope (MFM) uses a very fine magnetically-coated tip mounted on a cantilever to measure magnetic force as it is scanned across the surface of a sample. The resolution is high enough to allow imaging the magnetization structure inside domain walls.

Here are links to more details regarding sample preparation